Embedded
Pre-tested System-on-Chip Design Accelerates PLD Development
Many moderate size Programmable Logic Device (PLD) designs, especially those in control plane applications,...
Device Security for the IIoT
The Industrial Internet of Things (IIoT) is driving investment in new technology and manufacturing methodologies...
Adapteva for base station signal processing
Benchmarking the worlds most FLOPS/Wefficient computer. This whitepaper includes information regarding...
Output Power Measurement on Noise Sources
Noise sources used for noise figure and gain measurements are typically controlled by the spectrum analyzer...
dB or not dB?
True or false: 30 dBm + 30 dBm = 60 dBm? Why does 1% work out to be -40 dB one time but then 0.1 dB or...
FPGAs in Next Generation Wireless Networks
In addition to voice connectivity, digital cellular wireless networks such as GSM and its enhancement,...
Benefits of Self-Encrypting Drives (SEDs)
SSDs require different methods of sanitization compared to traditional hard disk drives (HDDs) due to...
Accurate Test Fixture Characterization and Deembedding
For measurements of non-connectorized devices, test fixtures, probes or other structures are used to...
Solid-State Drives in Embedded Systems
Typical rotating media is perceived to be among the most significant causes of machine downtime in industrial...
Fundamentals of Building a Test System
Most organizations do not consider production test a top priority, but it is a necessity to prevent major...
AURIXâ„¢ as a safety controller and ISO 13849
Benefit from the experts of the AURIXâ„¢ Preferred Design House and download our white paper! Infineon's...
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