Embedded
Reducing CompactFlash Re-Qualification Time
Industrial grade CompactFlash (CF) has been a storage workhouse for embedded systems since the turn of...
Output Power Measurement on Noise Sources
Noise sources used for noise figure and gain measurements are typically controlled by the spectrum analyzer...
MEMS Timing-Keeper Extends Standby Life of Mobile Devices
With increasingly sophisticated Smartphones and mobile devices offering more features and un-tethered...
Pre-tested System-on-Chip Design Accelerates PLD Development
Many moderate size Programmable Logic Device (PLD) designs, especially those in control plane applications,...
dB or not dB?
True or false: 30 dBm + 30 dBm = 60 dBm? Why does 1% work out to be -40 dB one time but then 0.1 dB or...
Fundamentals of Reliable Flash Storage: An Introduction to Security
Not a single day passes without major news of data breaches. Whether it is database theft or taking control...
The Ultimate Guide to ECU Production Test Systems
Modern vehicles can contain over 100 ECUs controlling everything from the drivetrain to the ADAS systems....
Are smart beacons the next step in the third industrial revolution?
We digitally check in before we even reach the airport. And rather than printing tickets, we add our...
Solid-State Drives in Embedded Systems
Typical rotating media is perceived to be among the most significant causes of machine downtime in industrial...
Ultimate Guide to Functional Safety and Safety Certification
Functional safety actively prevents the failure of a system from causing harm to people and property....
Interfacing Microcontrollers to the Industrial World
Utilizing embedded microcontrollers for industrial applications requires special attention given the...
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