Embedded
XMOS Timing Analyzer Whitepaper
To guarantee the correct behavior of real-time software running on embedded processors can pose a significant...
MEMS Timing-Keeper Extends Standby Life of Mobile Devices
With increasingly sophisticated Smartphones and mobile devices offering more features and un-tethered...
Reducing Cost and Power in Consumer Applications Using PLDs
The need to respond to changing market standards in a compressed time to market window has led to the...
The Past, Present and Future of Cybersecurity for Embedded Systems
The only system that's safe from cyberthreats is one that's never powered on. While this is an overstatement...
High-Speed SERDES Interfaces In High Value FPGAs
Lattice Semiconductor has introduced two low cost FPGA families with SERDES, the LatticeECP2M, introduced...
Device Security for the IIoT
The Industrial Internet of Things (IIoT) is driving investment in new technology and manufacturing methodologies...
The Energy Harvesting Tipping Point for Wireless Sensor Applications
Ever since the first watermills and windmills were used to generate electricity, energy harvesting has...
The Efficiency Challenge
With the digital expansion over the past few decades, new requirements for data centers to store, transmit,...
How To Select the Right IoT Platform
Although it has been with us in some form and under different names for many years, the Internet of Things...
The Need for Security
With the recent rise of the Internet of Things (IoT), 14 billion devices are now connected. However,...
5 Reasons to Consider an Alternative to Linux for Your Medical Device
Medical device designers have become increasingly interested in the Linux® operating system (OS), largely...
Key Considerations for Powertrain HIL Test
Safety, availability, and cost considerations can make performing thorough tests of embedded control...
Choosing the Right RF Switches for Smart Mobile Device Applications
This paper will give an overview of both high and low throw-count RF switches used in different circuit...
Accurate Test Fixture Characterization and Deembedding
For measurements of non-connectorized devices, test fixtures, probes or other structures are used to...
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