Automotive

Accurate Test Fixture Characterization and Deembedding
For measurements of non-connectorized devices, test fixtures, probes or other structures are used to...

DEVELOPMENT OF HIGH-PERFORMANCE, HIGH-VOLUME CONSUMER MEMS GYROSCOPES
This paper discusses the challenges and success factors for creating the world's first integrated MEMS...

Device Security for the IIoT
The Industrial Internet of Things (IIoT) is driving investment in new technology and manufacturing methodologies...

Accumold overview
These micro molding guidelines reflect some of the capabilities we have been asked for and are intended...

Advanced Driver Assistance Systems - Test Solutions
As advanced driver assistance systems (ADAS) introduce new technology into vehicles, they need adaptable,...

EMC Challenges in Connected Cars
New vehicles contain a dazzling array of electronics. Trends such as the ‘connected car', driver assistance...

Skyworks De-embedded Scattering Parameters
An integral part of modern RF/microwave circuit design is circuit simulation and evaluation in which...

NEW APPROACHES TO HARDWARE ACCELERATION USING ULTRA LOW DENSITY FPGAs
Ask system designers to list the problems they face – it doesn't matter whether they're building mobile...

Automotive Research User Handbook
Within the next 10 years, we will see remarkable change in the automotive industry from improved engine...

Moving Forward With Bluetooth Low Energy
Bluetooth® Low Energy (BLE) may not be part of your electronic designs just yet, but chances are it...
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